Developed to fulfill customer requirements, the systems are designed for testing both crystalline and thin-film PV modules. As more "thin-film" PV products are introduced, the requirement for high quality long pulse simulation systems will dramatically increase.

The programmable pulse duration and acquisition delay overcome the inherent problem some thin-film PV materials experience when illuminated with short pulses.

EYE / Iwasaki, a leader in applied lighting technology, utilized its 60 years of experience in developing this unique optical system. The exceptional spectral concurrence to the IEC AM1.5 irradiance distribution standard guarantees accurate results regardless of PV module band-gap.

Outstanding system performance and flexibility allows stand-alone use in development labs, or integration with upstream/downstream systems in continuous manufacturing processes. Comprehensive MS-Windows based test software allows the PV performance data to be easily integrated with process systems' software.

Initially, two systems are being introduced; a Class AAA system capable of testing panels up to 1.2m x .6m, and a large area (1.4m x 1.0m) Class ABA system. Up to 1000 points can be acquired per pulse, depending upon the selected acquisition rate and pulse duration.

The integrated high power bi-polar power supply provides the ability to test all types of thin-film PV modules along with the added advantage of performing dark I-V tests for diagnostics.

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